Spectroscopic Ellipsometers
M-2000
Rotating compensator technology. Many spectral ranges available up to 193-1690 nm.
RC2
Dual rotating compensator technology gives you the ability to determine all 16 Mueller Matrix elements.
iSE
Dedicated in situ instrument for applications that require real-time results.
theta-SE
Dedicated high-speed and compact mapping ellipsometer.
VASE
Variable angle spectroscopic ellipsometer with wide spectral range of up to 193-4000 nm.
alpha 2.0
Spectroscopic Ellipsometry has never been easier! Simple, low cost system for measuring index and thickness. Spectral range of 400-1000 nm.
IR-VASE Mark II
Covers a wide spectral range from 2 to 30 microns. This ellipsometer is used to characterize both thin films and bulk materials.
VUV-VASE
Spectroscopic ellipsometer covering the vacuum UV to the NIR. Perfect for lithography applications at 248 nm, 193 nm, and 157 nm. Spectral range up to 146-2500nm.
