Spectroscopic Ellipsometry is an experimental technique for determining the thicknesses and optical properties of thin films. It is widely used across many areas where thin films are found including semiconductor devices, displays, solar cells, data storage, optical coatings, biological and medical coatings, and more.
In this webinar we will break down spectroscopic ellipsometry and discuss the theory behind it. This will include discussion on polarized light, ellipsometer components, interaction of light and materials, measured quantities (Psi & Delta), and data analysis.
*This webinar is being provided at no charge and everyone is welcome*
Topics:
- What is Ellipsometry?
- Psi & Delta Spectrum
- Polarized Light
- Ellipsometer Components
- Advantages of Ellipsometry
- Sensitivity to Thin Films
- Data Analysis Flow
- Regression Analysis
- Mean Squared Error (MSE)
- Multi-Layer Coatings
- Ellipsometry Applications
- Data Analysis Overview and Examples
Presenters
Tom Tiwald
James Hilfiker
